Author: Trenikhina, Y.
Paper Title Page
THP014 First Direct Imaging and Profiling TOF-SIMS Studies on Cutouts from Cavities Prepared by State-of-the-Art Treatments 866
  • A.S. Romanenko, A. Grassellino, M. Martinello, Y. Trenikhina
    Fermilab, Batavia, Illinois, USA
  • D. Bafia
    Illinois Institute of Technology, Chicago, Illinois, USA
  Funding: This work has been authored by Fermi Research Alliance, LLC under Contract No. DE-AC02-07CH11359 with the U.S. Department of Energy, Office of Science, Office of High Energy Physics.
Small amounts of interstitial impurities in the penetra-tion depth of superconducting radio frequency (SRF) cavities have a dramatic effect on the quality factors and maximum accelerating gradients. Here we report the first TOF-SIMS studies of cutouts from cavities prepared by all modern surface treatments, which allow a direct corre-lation of the impurity distribution with the observed cavity performance. Imaging capability of our instrument allows to avoid the possible issues associated with the ‘‘ghost’’ depth profiles appearing as a consequence of particulate surface contamination, which likely caused the inconclusive SIMS results on e.g. oxygen diffusion in the past.
DOI • reference for this paper ※  
About • paper received ※ 02 July 2019       paper accepted ※ 04 July 2019       issue date ※ 14 August 2019  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)