Author: Moeckly, B.
Paper Title Page
THP044 RF Characterization of Novel Superconducting Materials and Multilayers 950
SUSP021   use link to see paper's listing under its alternate paper code  
  • T.E. Oseroff, M. Liepe, Z. Sun
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  • B. Moeckly
    STI, Santa Barbara, California, USA
  • M.J. Sowa
    Veeco-CNT, Medford, USA
  Cutting edge SRF technology is likely approaching the fundamental limitations of niobium cavities operating in the Meissner state. This combined with the obvious advantages of using higher critical temperature superconductors and thin film depositions leads to interest in the RF characterization of such materials. A TE mode niobium sample host cavity was used to characterize the RF performance of 5" (12.7 cm) diameter sample plates as a function of field and temperature at 4 GHz. Materials studied include MgB2 and thin film atomic layer deposition (ALD) NbN and NbTiN on Nb substrates. These higher critical temperature superconductors all having coherence lengths on the order of a few nm. It is therefore likely that defects on the order of the coherence lengths will cause early flux penetration well before the theorized superheating field of an ideal superconducting surface. Superconductor-insulator-superconductor (SIS) multilayers have been proposed as a mechanism of arresting these early penetration flux avalanches and are therefore studied here as well, using the same NbN and NbTiN films, but over thin layers of insulating AlN on Nb substrates.  
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About • paper received ※ 02 July 2019       paper accepted ※ 03 July 2019       issue date ※ 14 August 2019  
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