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TY - CONF AU - Romanenko, A.S. AU - Bafia, D. AU - Grassellino, A. AU - Martinello, M. AU - Trenikhina, Y. ED - Michel, Peter ED - Arnold, André ED - Schaa, Volker RW TI - First Direct Imaging and Profiling TOF-SIMS Studies on Cutouts from Cavities Prepared by State-of-the-Art Treatments J2 - Proc. of SRF2019, Dresden, Germany, 30 June-05 July 2019 CY - Dresden, Germany T2 - International Conference on RF Superconductivity T3 - 19 LA - english AB - Small amounts of interstitial impurities in the penetra-tion depth of superconducting radio frequency (SRF) cavities have a dramatic effect on the quality factors and maximum accelerating gradients. Here we report the first TOF-SIMS studies of cutouts from cavities prepared by all modern surface treatments, which allow a direct corre-lation of the impurity distribution with the observed cavity performance. Imaging capability of our instrument allows to avoid the possible issues associated with the ‘‘ghost’’ depth profiles appearing as a consequence of particulate surface contamination, which likely caused the inconclusive SIMS results on e.g. oxygen diffusion in the past. PB - JACoW Publishing CP - Geneva, Switzerland SP - 866 EP - 870 KW - cavity KW - niobium KW - SRF KW - GUI KW - superconductivity DA - 2019/08 PY - 2019 SN - 978-3-95450-211-0 DO - doi:10.18429/JACoW-SRF2019-THP014 UR - http://jacow.org/srf2019/papers/thp014.pdf ER -