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RIS citation export for THP014: First Direct Imaging and Profiling TOF-SIMS Studies on Cutouts from Cavities Prepared by State-of-the-Art Treatments

TY  - CONF
AU  - Romanenko, A.S.
AU  - Bafia, D.
AU  - Grassellino, A.
AU  - Martinello, M.
AU  - Trenikhina, Y.
ED  - Michel, Peter
ED  - Arnold, André
ED  - Schaa, Volker RW
TI  - First Direct Imaging and Profiling TOF-SIMS Studies on Cutouts from Cavities Prepared by State-of-the-Art Treatments
J2  - Proc. of SRF2019, Dresden, Germany, 30 June-05 July 2019
CY  - Dresden, Germany
T2  - International Conference on RF Superconductivity
T3  - 19
LA  - english
AB  - Small amounts of interstitial impurities in the penetra-tion depth of superconducting radio frequency (SRF) cavities have a dramatic effect on the quality factors and maximum accelerating gradients. Here we report the first TOF-SIMS studies of cutouts from cavities prepared by all modern surface treatments, which allow a direct corre-lation of the impurity distribution with the observed cavity performance. Imaging capability of our instrument allows to avoid the possible issues associated with the ‘‘ghost’’ depth profiles appearing as a consequence of particulate surface contamination, which likely caused the inconclusive SIMS results on e.g. oxygen diffusion in the past.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 866
EP  - 870
KW  - cavity
KW  - niobium
KW  - SRF
KW  - GUI
KW  - superconductivity
DA  - 2019/08
PY  - 2019
SN  - 978-3-95450-211-0
DO  - doi:10.18429/JACoW-SRF2019-THP014
UR  - http://jacow.org/srf2019/papers/thp014.pdf
ER  -